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AIDA GELINA BRIKEN nToF CRIB ISOLDE CIRCE nTOFCapture DESPEC DTAS EDI_PSA 179Ta CARME StellarModelling DCF K40

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Entry time:	Wed Mar 26 07:27:59 2025
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> Analysis data files R4_351-396 > > > Data file R4_351 first WR ts 0x17D7B4C72B0BA9C8 > Converting hexadecimal timestamp to decimal: 1718040550378809900 > Assuming that this timestamp is in nanoseconds (1 billionth of a second): > GMT: Monday, June 10, 2024 5:29:10.378 PM > Your time zone: Monday, June 10, 2024 6:29:10.378 PM GMT+01:00 DST > Relative: 8 months ago > > Data file R4_396 first WR ts 0x17D7BE86408888E8 > Converting hexadecimal timestamp to decimal: 1718051266682718500 > Assuming that this timestamp is in nanoseconds (1 billionth of a second): > GMT: Monday, June 10, 2024 8:27:46.682 PM > Your time zone: Monday, June 10, 2024 9:27:46.682 PM GMT+01:00 DST > Relative: 8 months ago > > Attachments 1-2 - analysis data files R4_351 and R4_396 > max. time averaged deadtime FEE64 #7 (aida08) 1.7% and 1.7% respectively > all other FEE64 deadtimes < 1% > > > > > > FEE64 configuration > > FEE64 a b c > g h > d e f > > a b c d e f g h > DSSSD#1 15 3 12 9 1 5 2 4 > DSSSD#2 11 7 16 10 14 13 6 8 > > n+n Ohmic FEE64s 2, 4, 6, 8 > > Data analysis assumes > > - all LEC ADC data channels with valid ADC offset included (1012 of 1024 channels) > LEC calibration ADC offset only > > - no clustering > > - no multiplex timestamp correction > > - no p+n junction side - n+n Ohmic side correlation time gates > > - FEE64 not DSSSD strip ordering > > - hardware - slow comparator setting p+n junction FEE64s 100keV, n+n Ohmic FEE64s 150keV > > - LEC energy difference +/- 11200keV (wide open for first pass analysis) > > - HEC energy difference +/- 1.68GeV > > - valid LEC events > > p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1 > > LEC energy > 151keV > to select candidate beta and alpha events - will include light ions > standalone analysis of AIDA data, no downstream veto detector > > - valid HEC events > p+n junction side multiplicity > 0 and n+n Ohmic side multiplicity > 0 > > (x,y) strips corresponding to maximum energy > p+n junction and n+n Ohmic side HEC > > - HEC veto > p+n junction side multiplicity > 0 or n+n Ohmic side multiplicity > 0 > > - per pixel implant-decay correlations > > - end of event > difference in WR timestamp between successive ADC data items > 2500 and overall event length < 33us > > > > > Number of events observed > > *** scaler # 1 count: 35941696 DSSSD#1 decay events LEC m_p = 1 and LEC m_n = 1, ADC data > 151.2keV and HEC m_p = HEC m_n = 0, ADC data > 151.2MeV > *** scaler # 2 count: 31960753 DSSSD#2 decay events LEC m_p = 1 and LEC m_n = 1, ADC data > 151.2keV and HEC m_p = HEC m_n = 0, ADC data > 151.2MeV > * scaler # 3 count: 1499844 DSSSD#1 implant events HEC m_p > 0 and HEC m_n > 0, ADC data > 151.2MeV > * scaler # 4 count: 1297356 DSSSD#2 implant events HEC m_p > 0 and HEC m_n > 0, ADC data > 151.2MeV > *** scaler # 5 count: 5446969 DSSSD#1 other events HEC m_p > 0 or HEC m_n > 0 and LEC m_p > 8 or LEC m_n > 8 > *** scaler # 6 count: 75030747 DSSSD#2 other events HEC m_p > 0 or HEC m_n > 0 and LEC m_p > 8 or LEC m_n > 8 > > DSSSD#1 implant events > x=m_p=0 ? > y=m_n=0 ? > > DSSSD#2 implant events > x=m_p=0 ? > y=m_n=0 ? > > > Attachments 3-6 - per FEE64 LEC data item rates 268ms/channel - common x and y scales > - no conditions > - 150keV < energy < 1500keV > - energy > 1500keV > > Some deadtime observed on spill, none observed off spill. No significant variation in per FEE64 LEC data rates. > > Attachments 7-8 - per FEE64 LEC hit patterns > - 150keV < energy < 1500keV > - energy > 1500keV > > Aside from usual hot channels at cable/DSSSD boundaries good hit pattern observed. For > 1500keV events observe flat field in x-plane, focussed in y-plane. > > Attachments 9-11 - per FEE64 HEC data item rates 268ms/channel - common x and y scales > - no conditions > - 100MeV < energy < 1000MeV > - energy > 1000MeV > > Note hot HEC channel in aida08 - should be disabled. > > Attachment 12 - per DSSSD decay and implant rates 262us/channel - common x and y scales > > Attachment 13 - per DSSSD LEC m_p versus m_n > - no conditions > > Attachment 14 - per DSSSD LEC p strip versus n strip > - no conditions > > Attachments 15-16 - per DSSSD LEC E_p versus E_n - x and y-axes 20keV/channel > - LEC energy difference +/- 2000 channels (+/- 11200keV) > > Attachments 17-18 - per DSSSD p strip versus n strip > - HEC-LEC time difference <1s > - HEC-LEC time difference <100s > > Attachment 19 - per DSSSD HEC m_p versus m_n > > Attachment 20 - per DSSSD HEC p strip versus n strip > - no conditions > - z_hec=1 => implant stops in DSSSD#1 > - z_hec=3 => implant hits DSSSD#1 and DSSSD#2 but does not necessarily stop in DSSSD#2 > > Attachment 21 - per DSSSD HEC E_p versus E_n - x and y axes 20MeV/channel > > Attachment 22 - DSSSD#1 HEC E_p versus DSSSD#2 HEC E_p - x and y axes 20MeV/channel > - few events stop in DSSSD#2 > - most events lower Z and A - fission fragments? > > Attachment 23 - per DSSSD per pixel HEC-LEC time difference 4.096us/channel > - events observed to <<100us > > Attachment 24 - per DSSSD per pixel HEC-LEC time difference (1s/channel) versus LEC energy (20keV/channel) > - alpha events long lived > - some evidence of effect of on spill deadtime in implant-decay correlations (cf. S100 and S505) > > Attachment 25 - per DSSSD implant and decay event p strip - n strip time difference (2us/channel) > - wider distribution for implant events as expected due to number of ASIC active channels in implant events > - most decay events +/-2us - lower ASIC occupancy for decay events so most events will be from same (or adjacent) clock cycle Encoding: HTML ELCode plain Suppress Email notification

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