ELOG DESPEC

AIDA GELINA BRIKEN nToF CRIB ISOLDE CIRCE nTOFCapture DESPEC DTAS EDI_PSA 179Ta CARME StellarModelling DCF K40

DESPEC

Fields marked with * are required
Entry time:	Tue Mar 25 20:23:53 2025
Author*:
Subject*:
> > Start 00:43 22.2.25 https://elog.gsi.de/despec/G-24-00302/57 > AIDA data file R9_85 > > Converting hexadecimal timestamp to decimal: 1740181266259754800 > Assuming that this timestamp is in nanoseconds (1 billionth of a second): > GMT: Friday, February 21, 2025 11:41:06.259 PM > Your time zone: Friday, February 21, 2025 11:41:06.259 PM GMT+00:00 > > > End 12:56 22.2.25 https://elog.gsi.de/despec/G-24-00302/85 (start of next degrader setting) > AIDA data file R9_199 > > Converting hexadecimal timestamp to decimal: 1740224934731157800 > Assuming that this timestamp is in nanoseconds (1 billionth of a second): > GMT: Saturday, February 22, 2025 11:48:54.731 AM > Your time zone: Saturday, February 22, 2025 11:48:54.731 AM GMT+00:00 > > Analysis data files FEB25/R9_85 and FEB25/R9_199 > - no timewarps > - deadtime aida05 c. 37% and 39% due to high SC41 scaler input to MACB - issue subsequently fixed > - deadtime aida04 c. 4%, all other FEE64s <<1% > > > > > FEE64 configuration > > FEE64 a b c > g h > d e f > > a b c d e f g h > DSSSD#1 15 3 12 9 1 5 2 4 > > n+n Ohmic FEE64s 2, 4 > > Data analysis assumes > > - all LEC ADC data channels with valid ADC offset included (507 of 512 channels) > LEC calibration ADC offset only > > - no clustering > > - no multiplex timestamp correction > > - no p+n junction side - n+n Ohmic side correlation time gates > > - FEE64 not DSSSD strip ordering > > - hardware - slow comparator setting p+n junction FEE64s 100keV, n+n Ohmic FEE64s 150keV > > - LEC energy difference +/- 168keV > > - HEC energy difference +/- 1.68GeV > > - valid LEC events > > p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1 > 151keV < LEC energy < 1000keV > to select candidate beta events > standalone analysis of AIDA data, no downstream veto detector > > - valid HEC events > p+n junction side multiplicity > 0 and n+n Ohmic side multiplicity > 0 > (x,y) strips corresponding to maximum energy > p+n junction and n+n Ohmic side HEC > > - HEC veto > not available - only 1x AIDA DSSSD installed > > - per pixel implant-decay correlations > > - end of event > difference in WR timestamp between successive ADC data items > 2500 and overall event length < 33us > > > > > > per FEE64 LEC ADC data items 268ms/channel - attachments 3-5 > - all > - 150keV < energy < 1500keV > - energy > 1500keV > > absence of high instantaneous rates on spill cf. S181, S100, S505 etc > spill structure visible for energies > 1500keV - probably to be expected as majority of such events should be light ions > > per FEE64 HEC ADC data items 268ms/channel - attachments 6-8 > > - all > - 100MeV < energy < 1000MeV > - energy > 1000MeV > > Implant & decay event rates 262us/channel - attachment 9 > > LEC m_p versus m_n - attachment 10 > > LEC e_p versus e_n - 20keV/channel - attachment 11 > > HEC x strip versus y strip - attachment 12 > > - HEC-LEC implant decay time difference <1s > - HEC-LEC implant decay time difference <100s > > shows x-y window used to select 82Nb events > > HEC m_p versus m_n - attachment 13 > > HEC e_p versus e_n - 20MeV/channel - attachment 14 > > > HEC-LEC implant-decay time difference (4ms/channel) versus - attachment 15 > - HEC energy > - LEC energy > - x & y strip > > x strips 130 & 136 disabled > > HEC & LEC p strip - n strip time difference (2us/channel, offset=2000 channels) - attachment 16 > > HEC E (20MeV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 17 > > LEC E (20keV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 18 > > LEC e_p - e_n (5.6keV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 19 > > HEC x & y strip versus implant-decay time difference (4.194ms/channel) - attachment 20 > > HEC-LEC implant-decay time difference (8.389ms/channel) for candidate 82Nb events - attachment 21 > - blue - forward > - cyan - backward > > Note > - no FRS PID > - no HEC dE > - no HEC veto > - no HEC energy gates - assume all events within x-y window stop in AIDA DSSSD - 82Nb events known to overlap in x-y with (longer-lived, more numerous) 83Nb events > - no front-back time difference > - no clustering > - all LEC channels with valid ADC offsets (507 of 512) included except 2x strips 130 & 136 > > HEC-LEC implant-decay time difference (8.389ms/channel) for candidate 82Nb events - attachment 22 > > Weighted least squares fit channels 1-12 half life 55(9)ms cf. NNDC 50.0(3)ms. Encoding: HTML ELCode plain Suppress Email notification

Attachment 1:
Drop attachments here...

ELOG V3.1.4-unknown