AIDA
GELINA
BRIKEN
nToF
CRIB
ISOLDE
CIRCE
nTOFCapture
DESPEC
DTAS
EDI_PSA
179Ta
CARME
StellarModelling
DCF
K40
MONNET
DESPEC
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> > Start 00:43 22.2.25 https://elog.gsi.de/despec/G-24-00302/57 > AIDA data file R9_85 > > Converting hexadecimal timestamp to decimal: 1740181266259754800 > Assuming that this timestamp is in nanoseconds (1 billionth of a second): > GMT: Friday, February 21, 2025 11:41:06.259 PM > Your time zone: Friday, February 21, 2025 11:41:06.259 PM GMT+00:00 > > > End 12:56 22.2.25 https://elog.gsi.de/despec/G-24-00302/85 (start of next degrader setting) > AIDA data file R9_199 > > Converting hexadecimal timestamp to decimal: 1740224934731157800 > Assuming that this timestamp is in nanoseconds (1 billionth of a second): > GMT: Saturday, February 22, 2025 11:48:54.731 AM > Your time zone: Saturday, February 22, 2025 11:48:54.731 AM GMT+00:00 > > Analysis data files FEB25/R9_85 and FEB25/R9_199 > - no timewarps > - deadtime aida05 c. 37% and 39% due to high SC41 scaler input to MACB - issue subsequently fixed > - deadtime aida04 c. 4%, all other FEE64s <<1% > > > > > FEE64 configuration > > FEE64 a b c > g h > d e f > > a b c d e f g h > DSSSD#1 15 3 12 9 1 5 2 4 > > n+n Ohmic FEE64s 2, 4 > > Data analysis assumes > > - all LEC ADC data channels with valid ADC offset included (507 of 512 channels) > LEC calibration ADC offset only > > - no clustering > > - no multiplex timestamp correction > > - no p+n junction side - n+n Ohmic side correlation time gates > > - FEE64 *not* DSSSD strip ordering > > - hardware - slow comparator setting p+n junction FEE64s 100keV, n+n Ohmic FEE64s 150keV > > - LEC energy difference +/- 168keV > > - HEC energy difference +/- 1.68GeV > > - valid LEC events > > p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1 > 151keV < LEC energy < 1000keV > to select candidate beta events > standalone analysis of AIDA data, no downstream veto detector > > - valid HEC events > p+n junction side multiplicity > 0 and n+n Ohmic side multiplicity > 0 > (x,y) strips corresponding to maximum energy > p+n junction and n+n Ohmic side HEC > > - HEC veto > not available - only 1x AIDA DSSSD installed > > - per pixel implant-decay correlations > > - end of event > difference in WR timestamp between successive ADC data items > 2500 and overall event length < 33us > > > > > > per FEE64 LEC ADC data items 268ms/channel - attachments 3-5 > - all > - 150keV < energy < 1500keV > - energy > 1500keV > > absence of high instantaneous rates on spill cf. S181, S100, S505 etc > spill structure visible for energies > 1500keV - probably to be expected as majority of such events should be light ions > > per FEE64 HEC ADC data items 268ms/channel - attachments 6-8 > > - all > - 100MeV < energy < 1000MeV > - energy > 1000MeV > > Implant & decay event rates 262us/channel - attachment 9 > > LEC m_p versus m_n - attachment 10 > > LEC e_p versus e_n - 20keV/channel - attachment 11 > > HEC x strip versus y strip - attachment 12 > > - HEC-LEC implant decay time difference <1s > - HEC-LEC implant decay time difference <100s > > shows x-y window used to select 82Nb events > > HEC m_p versus m_n - attachment 13 > > HEC e_p versus e_n - 20MeV/channel - attachment 14 > > > HEC-LEC implant-decay time difference (4ms/channel) versus - attachment 15 > - HEC energy > - LEC energy > - x & y strip > > x strips 130 & 136 disabled > > HEC & LEC p strip - n strip time difference (2us/channel, offset=2000 channels) - attachment 16 > > HEC E (20MeV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 17 > > LEC E (20keV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 18 > > LEC e_p - e_n (5.6keV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 19 > > HEC x & y strip versus implant-decay time difference (4.194ms/channel) - attachment 20 > > HEC-LEC implant-decay time difference (8.389ms/channel) for candidate 82Nb events - attachment 21 > - blue - forward > - cyan - backward > > Note > - no FRS PID > - no HEC dE > - no HEC veto > - no HEC energy gates - assume all events within x-y window *stop* in AIDA DSSSD - 82Nb events known to overlap in x-y with (longer-lived, more numerous) 83Nb events > - no front-back time difference > - no clustering > - *all* LEC channels with valid ADC offsets (507 of 512) included *except* 2x strips 130 & 136 > > HEC-LEC implant-decay time difference (8.389ms/channel) for candidate 82Nb events - attachment 22 > > Weighted least squares fit channels 1-12 half life 55(9)ms cf. NNDC 50.0(3)ms. > > > > Added 8.2.26 by TD > > Attachment 23 - implant timestamp, decay timestamp, decay timestamp - implant timestamp for selected events (attachment 21) with time differences < 255 x 4.194304ms > Attachment 24 - implant timestamp, decay timestamp, implant timestamp - decay timestamp for selected events (attachment 21) with time differences < 255 x 4.194304ms > > Attachment 25 - analysis program > > Attachment 27 - spectra titles > > Attachment 28 - analysis program variables > > > For data files R9_85 - R9_199 inclusive > > Total ADC data items 30117120061 > Total ADC events 6551938947 > > Questions from Giorgio Bruni Campanella Spezza > > 1) What were the exact number of implants, decays, correlated implants and decays and correlation efficiency? > > Implants ( m_p_hec(1) > 0 .and. m_n_hec(1) > 0 ) 1046107 > Decays ( m_p_lec(1) = 1 .and. m_n_lec(1) = 1 ) .and. ( ediff.LT.30 .and. ediff.GT.-30 ) 83342477 > > Selected implants s2112 > ( 75 < x < 150 .and. 30 < y < 120 ) .and. ( ediff.LT.300 .and. ediff.GT.-300 ) .and . ( 100 < hec_e < 4096 ) 215705 = 32.0/pixel = 0.000732/pixel/s > > Selected decays s2040 > ( 75 < x < 150 .and. 30 < y < 120 ) .and. ( ediff.LT.30 .and. ediff.GT.-30 ) .and. ( decay-implant < 1s ) .and. ( 27 < lec_e < 180 ) 1056 = 0.156/pixel = 0.00000358/pixel/s > Selected decays s2041 > ( 75 < x < 150 .and. 30 < y < 120 ) .and. ( ediff.LT.30 .and. ediff.GT.-30 ) .and. ( decay-implant < 100s ) .and. ( 27 < lec_e < 180 ) 38483 = 5.70/pixel = 0.000131/pixel/s > > 2) What is the number of correlated decays for the backward time correlations? > > Correlated forward decays s2226 (channels 0-255, 4.19ms/channel) = 1422 > Correlated backward decays s2224 (channels 0-255, 4.19ms/channel) = 778 > > 3) How exactly do you define beta detection efficiency for the decay of a specific isotope? I ask this due to the lack of a PID in the analysis, and hence, without any FRS-AIDA implant > correlation, how can you determine the number of implanted ions of a specific isotope? > > Yes - to calculate beta efficiency for 82Nb (say) I need an estimate of what fraction of selected implant events are actually 82Nb > > 4) Do you have any vetoes for the position of implants in AIDA, or do you accept all implants throughout the DSSSD? > > See definitions above - there are gates for x and y strips and implant energy
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