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AIDA
GELINA
BRIKEN
nToF
CRIB
ISOLDE
CIRCE
nTOFCapture
DESPEC
DTAS
EDI_PSA
179Ta
CARME
StellarModelling
DCF
K40
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DESPEC |
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Message ID: 700
Entry time: Sat Feb 22 12:35:38 2025
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Author: |
TD |
Subject: |
Offline analysis data files R9_85-R9_199 (84Mo setting) |
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Start 00:43 22.2.25 https://elog.gsi.de/despec/G-24-00302/57
AIDA data file R9_85
Converting hexadecimal timestamp to decimal: 1740181266259754800
Assuming that this timestamp is in nanoseconds (1 billionth of a second):
GMT: Friday, February 21, 2025 11:41:06.259 PM
Your time zone: Friday, February 21, 2025 11:41:06.259 PM GMT+00:00
End 12:56 22.2.25 https://elog.gsi.de/despec/G-24-00302/85 (start of next degrader setting)
AIDA data file R9_199
Converting hexadecimal timestamp to decimal: 1740224934731157800
Assuming that this timestamp is in nanoseconds (1 billionth of a second):
GMT: Saturday, February 22, 2025 11:48:54.731 AM
Your time zone: Saturday, February 22, 2025 11:48:54.731 AM GMT+00:00
Analysis data files FEB25/R9_85 and FEB25/R9_199
- no timewarps
- deadtime aida05 c. 37% and 39% due to high SC41 scaler input to MACB - issue subsequently fixed
- deadtime aida04 c. 4%, all other FEE64s <<1%
FEE64 configuration
FEE64 a b c
g h
d e f
a b c d e f g h
DSSSD#1 15 3 12 9 1 5 2 4
n+n Ohmic FEE64s 2, 4
Data analysis assumes
- all LEC ADC data channels with valid ADC offset included (507 of 512 channels)
LEC calibration ADC offset only
- no clustering
- no multiplex timestamp correction
- no p+n junction side - n+n Ohmic side correlation time gates
- FEE64 *not* DSSSD strip ordering
- hardware - slow comparator setting p+n junction FEE64s 100keV, n+n Ohmic FEE64s 150keV
- LEC energy difference +/- 168keV
- HEC energy difference +/- 1.68GeV
- valid LEC events
p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1
151keV < LEC energy < 1000keV
to select candidate beta events
standalone analysis of AIDA data, no downstream veto detector
- valid HEC events
p+n junction side multiplicity > 0 and n+n Ohmic side multiplicity > 0
(x,y) strips corresponding to maximum energy
p+n junction and n+n Ohmic side HEC
- HEC veto
not available - only 1x AIDA DSSSD installed
- per pixel implant-decay correlations
- end of event
difference in WR timestamp between successive ADC data items > 2500 and overall event length < 33us
per FEE64 LEC ADC data items 268ms/channel - attachments 3-5
- all
- 150keV < energy < 1500keV
- energy > 1500keV
absence of high instantaneous rates on spill cf. S181, S100, S505 etc
spill structure visible for energies > 1500keV - probably to be expected as majority of such events should be light ions
per FEE64 HEC ADC data items 268ms/channel - attachments 6-8
- all
- 100MeV < energy < 1000MeV
- energy > 1000MeV
Implant & decay event rates 262us/channel - attachment 9
LEC m_p versus m_n - attachment 10
LEC e_p versus e_n - 20keV/channel - attachment 11
HEC x strip versus y strip - attachment 12
- HEC-LEC implant decay time difference <1s
- HEC-LEC implant decay time difference <100s
shows x-y window used to select 82Nb events
HEC m_p versus m_n - attachment 13
HEC e_p versus e_n - 20MeV/channel - attachment 14
HEC-LEC implant-decay time difference (4ms/channel) versus - attachment 15
- HEC energy
- LEC energy
- x & y strip
x strips 130 & 136 disabled
HEC & LEC p strip - n strip time difference (2us/channel, offset=2000 channels) - attachment 16
HEC E (20MeV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 17
LEC E (20keV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 18
LEC e_p - e_n (5.6keV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 19
HEC x & y strip versus implant-decay time difference (4.194ms/channel) - attachment 20
HEC-LEC implant-decay time difference (8.389ms/channel) for candidate 82Nb events - attachment 21
- blue - forward
- cyan - backward
Note
- no FRS PID
- no HEC dE
- no HEC veto
- no HEC energy gates - assume all events within x-y window *stop* in AIDA DSSSD - 82Nb events known to overlap in x-y with (longer-lived, more numerous) 83Nb events
- no front-back time difference
- no clustering
- *all* LEC channels with valid ADC offsets (507 of 512) included *except* 2x strips 130 & 136
HEC-LEC implant-decay time difference (8.389ms/channel) for candidate 82Nb events - attachment 22
Weighted least squares fit channels 1-12 half life 55(9)ms cf. NNDC 50.0(3)ms. |
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