Steady for dE, E. Possibly rising on PHDI- monitor closely.

***note that DEED 16 was on old sampling rate for 205168- so use next run, also DEED 9-12 not plugged in***


  DEED16: (1 bin = 2 ch)

Pulser (DAQ):
- Centroid = 5347(3) ch
- FWHM = 89(7) ch = 1.7%
 

Pulser (Maestro):
- Centroid = 4279 ch
- FWHM = 166 ch = 3.9%

*** take the following with a pinch of salt- low stats (top of peak in DAQ = 4 counts)

148Gd (DAQ):
- Centroid = 1948 ch
- FWHM = 138 ch = 7%

148Gd (Maestro):
- Centroid = 1586 ch
- FWHM = 11 ch = 0.7%

 DEED6: (1 bin = 2 ch)

Pulser (DAQ):
- Centroid = 5145.6(6) ch
- FWHM = 51.4(1) ch = 1%
 

Pulser (Maestro):
- Centroid = 4042 ch
- FWHM = 137 ch = 3.3%
 

148Gd (DAQ):
- Centroid = 1980(1) ch
- FWHM = 64(2) ch = 3.2%

148Gd (Maestro):
- Centroid = 1564 ch
- FWHM = 61 ch = 3.9%

 DEED1: (rebin x2 -> 1 bin = 4 ch)

Pulser (DAQ):
- Centroid = 5000(1) ch
- FWHM = 71(5) ch = 1.4%
 

Pulser (Maestro):
- Centroid = 4008 ch
- FWHM = 148 ch = 4%
 

148Gd (DAQ):
- Centroid = 1880(1) ch
- FWHM = 89(2) ch = 4.7%

148Gd (Maestro):
- Centroid = 1524 ch
- FWHM = 67 ch = 4.4%

 

 Pulser set to 100 pps.

Shaping amp:
Gain: 1x1.0x50
Tau: 2 us
Negative polarity.

Process alpha data
- Compare pulser width and alpha width to calibration spectra (shaping amp with 1us and gain 50x)
- Does photodiode data process OK or is it a problem with the oscillations?

Process LiF data
- Any pile up issues? Problems with gamma flash?

Online monitoring:
- Check leakage every few days, check lab temp.
- Check alpha peaks of 26Al contaminants - Gd, B.
 

 Leakage before take down:
de 0.07 micro A
E 0.47 micro A

Removed source and removed Li sample for blank frame test

Leakage
DE 0.06micro A
E 0.41 micro A

DAQ 
56.25 sample rate all except EBED 5,6,7

Alpha source in - containing 148Gd, 241Am, 239Pu, 244Cm (4x 1kBq)

Leakage on arrival
dE 0.08microA , 19V
E 0.48microA 132V

At leaving
dE 0.08 micro A
E 0.41 micro A

Pulser to 20ms (2015-10-07_13.58.08.jpg)

DAQ:

EBED 5,6,7 have post sample 16382
Increased further at 4pm - 16000+ post sample for 225 samples

 

 Pulser out of 5,6,7 EFED- extended to 32ms

Changed full scale on ADC to 0.2V,
Offset changed by factor of 10.
Zero suppression on, de -3mV thresh
E +-5mV thresh
Post sample 4096

5pm increased post sample for spd-02886 to 8192 as higher sample rate due to pick up.

Corrected EBED 4 offset.

(Again, all DAQ settings also recorded to the nToF erunbook)

Changed pulser to 13ms.

 Leakage tues am
0.03 microA dE
0.52 microA E

Before leaving at 11.30am or so-
Bias dE up to 20V, leakage to 0.07microA
E has 0.51 microA

Problem solving dE signals...
SIG l6d6 a has signal of 600mV
SIG 24 has signal of 500mV
White noise is comparable, but transient ringing on l6d6 could indicate higher capacitance

Testing dE for signal with alpha source- but removed before continuing run.
dE sees particles after rotating ribbon by 180 degrees (abnormal detector)

External pulser triggering (2015-10-06_11.30.jpg )
Pulsar trigger, +2.5V external from proton pulse (10ms before beam), lasts 1ms (width).

Convert pulse input from TTL to NIM to go into delay (15ms).
Start delay in dual timer, then output to trigger pulser (TTL)

some photos in high resolution of the test setup 5-10 October 2015

 Note that detailed DAQ information available from project-ntof.cern.ch erunbook ear2.

As a rough guide: 6/7 mV per MeV

5mV thresh back side E, -5mV front E
-5mV dE
Implemented from Run 203388

From Run 203389
-7mV in Deed 8&9, EFED
+7mV in EBED

Run 203390
Thresholds back to -6mV for deed 8&9

Gamma flash ends at 70micro sec, corresponds to neutron energy of ~200keV...

Fairly self explanatory, note that images with time-stamps before 13.08.29 were taken before fitting the o-ring on the flange and therefore lateral positions will be different to photos after 13.08.29. Individual detector heights were not changed.

600mV in 50ohm coax with 25 hz pulser (positive signal) - see 2015-10-05_15.19.54.jpg and 2015-10-05_15.22.46.jpg

Leakage currents on detectors:

In air
10v: 0.03 micro amp det 1 leakage -dE
132v: 0.47micro amp det 2 leakage- E det

In vacuum
DE 0.04 micro amp
E 0.46 micro amp

Same size of signal at ADC hence 50 ohms coaxial.

The following channel explanations refer to cables at control area (not vault) see (2015-10-05_15.19.54.jpg) for full wiring information.

dE det= DEED 0 to -2V full scale, Lower limit 1800mV, Threshold 0V, thresh neg, pre 1024, post 2048, 20ms window, sample rate 225 MS/s
- L6D6 A = de 4
- L6D6 B = de 5
- L6D6 C = de 6
- L6D6 D = de 7
- LaBr 3 = de 8
- 21 = de 9

E det front= EFED 0 to -2V full scale, Lower limit 1800mV, Threshold 0V, thresh neg, pre 1024, post 2048, 20ms window, sample rate 225 MS/s
- 10 = Ef 3
- 12 = Ef 4
- 13 = Ef 5
- 14 = Ef 6
- 15 = Ef 7

E det back= EBED 0 to +2V full scale, Lower limit -200mV, Threshold 0V, thresh pos, pre 1024, post 2048, 20ms window, sample rate 225 MS/s (except EBED 5,6,7 which MUST be 900MS/s due to beam pick up signal)
- 16 = Eb 3
- 18 = Eb 4
- 20 = Eb 5
- 38 = Eb 6
- 40 = Eb 7

Run number 203385 on https://project-ntof.web.cern.ch/project-ntof/eRunbookEAR2.php

 20 micron (see 2015-10-05_12.46.59.jpg for detailed information) and 500 micron detectors

Testing preamps using pulser through common wire to both sets of preamps (see 2015-10-05_13.12.01.jpg).

64 x 14mA pos signals 15V
64 x 4mA neg signals 15V (see 2015-10-05_12.02.00.jpg for example on oscilloscope)

Sample has 105 microgram Li-6 (LiF - 95% enriched) 105 micron thick (2015-10-05_12.12.15.jpg is Li-6 side up, 2015-10-05_12.12.26.jpg is Li-6 side down... do not mix up!)

dE uses 22, 23 on ribbon connector, E 24, 25
dE from bias supply 2, E from bias 1

de and E pos signals needed to be inverted using jumpers. de negs not used, only 16ch (see 2015-10-05_14.59.12.jpg)

de first and last (0,15) are noisy- don't use. E detector ch 0 doesn't work.
Channels used dE 4-9, E(pos) 3-7 and E(neg) 3-7 (see 2015-10-05_15.11.37.jpg and 2015-10-05_15.11.44.jpg)