 Mon Mar 18 18:04:43 2024, NH, Preparation for pre-s100 dry run (and test beam???)
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In preparation for the dry run the following *temporary* changes to the FEE numbering have been prepared
These should be reverted after the dry run to ensure cable->fee agreement again
AIDA09 => AIDA06
AIDA11 => AIDA07
AIDA12 => AIDA08
This will allow the merger to run with 8 FEEs for 1 DSSD
dhcpd.conf updated
The 2023Oct19-13.46.30 should work with this numbering (check tomorrow)
As should layout GSI_triple_test_renumber
AFTER dry run:
Revert DHCP and prepare for full 16 FEEs
Make new ASIC settings key for 16 FEEs and prepare the aidaXX folders
Prepare a new Layout.mlf set |
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Tue Jul 7 08:04:57 2020, NH, Power failure in Messhuette
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Last week there was a power failure in Messhuette (FRS control room) - AIDA-3 and MBS were affected.
AIDA itself and S4 equipment is on UPS and was not shut down.
AIDA-3 has been restarted and MIDAS restarted. All seems OK
S4 conditions: 24.2 C / 33.5% RH / Td = 7.1 C |
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Mon Aug 28 12:47:56 2023, NH, Power Failure 24.08.2023
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There was a power failure in the morning of 24.08.2023 in the Rhein-Main area affecting GSI
The Aida workstation (aida-3) has been restarted, it is unknown if the Pis in S4 rebooted as well (there is a UPS)
29.8.23 TD Both RPi systems rebooted four days ago. |
Wed Jan 31 15:27:07 2024, TD, Photos of water flow & dew point sensor interlock box 
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Attachment 1 - 4 socket input connectors ( from sensor to interlock box )
Attachment 2 & 2 - 24V dc relays and internal wiring
Attachment 4 - 3 socket input connector ( from interlock box to USB-controlled ac mains relay ) |
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Thu Mar 12 23:44:48 2020, DK, PID Plots
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Labelled PID plots. Note that the A/Q calibration is shifted by +0.02 units, and Z calibration is offset by about +5.
There was an error in the printouts for Cd isotopes, but the below attachments are corrected.
The Z-depth (color, not nuclear charge) is log scale. |
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Thu Apr 25 22:45:30 2024, Tom, Muneerah, Norah, Over night shift AIDA 26 Fri 9x
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01:02
Aida04 was zero not reading had to call Tom to fix it.
02:00 checked all good and attached.
Its been running good after that till 7:30 again the same problem happened and Tom fixed it.
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Thu Oct 6 16:51:49 2022, NH, Oscilloscope analysis 24x
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Investigating AIDA noise with a TA041 differential probe and oscilloscope
AC Mains (DESPEC platform AC, L-N)
Probe attentuation = 1:100
Fig 1: Main AC waveform [X: 5ms/div, Y: 100 V/div]
Fig 2: Zoomed in at peak (20 V FSR, any less and the waveform clipped) [X: 10us/div, Y: 20V/div]
Fig 3: Longer time base and FFT of 0-5 MHz. No significant frequency harmonics noticed [X: 5ms/div, Y:20 V, FFT X: 500 kHz/div, Y: 10 dBm/div]
No significant noise or distortion present, fully within any AC specification.
Note that at the moment there is almost no load on AC
Equipment on on DESPEC rack: AIDA NIM, AIDA Raspberry Pis, bPlas PC (+ WR) + 2x DESPEC NIM crates
No autofill, VME crate or detectors
All big machines at GSI (SIS, FRS) off (suspect pumps are on)
Ion catcher not on (I think under repair)
-
FEE PSU studies
Probe connected to 5V exposed power pin on FEE64 (+v) and to grounding crimp on FEE64 (-v)
No adapter board connected
Attentuation = 1:10
Fig 4: FFT when FEEs are *off* - essentially probe+scope noise [X: 5ms/div, Y: 100 mV/div, FFT: X: 500 kHz/div, Y: 10 dBm/div]
Fig 5: FFT when FEEs are *on* - notice 1.4 MHz peak in FFT, also seen on ADC waveform readout before (fig 6) [X: 5ms/div, Y: 100 mV/div, FFT: X: 500 kHz/div, Y: 10 dBm/div]
Fig 7: 500 ns/div 5V output on FEE, single FEE on the PSU [X: 500 ns/div, Y: 100 mV/div]
Note average max voltage is 5.31 V (power on) and ~ 70 mV "peak to peak" -might be from probe/scope?
Also see voltage changes with FEE power draw:
Power on : 5.45 V (different scale to above)
SETUP ran : 5.51 V
FADCs off : 5.86 V
ACQ Go: : Unchanged; ASIC threshold 0xa: Unchanged
Also check situation on a fully loaded PSU (8 fees connected and powered on)
Power on: 5.29 V (fig 8)
SETUP ran: 5.36 V (fig 9)
FADCs off: 5.64 V (fig 10)
All X: 500 ns/div, Y: 100 mV/div
Both cases observe voltage rises as current draw drops (as expected for voltage drop along a cable)
Noise on 'scope seems to get slightly worse with reduced current (and higher voltage)
No sign of strong 100 kHz noise as seen in ADC traces beforehand
Todo:
- Check -6V and 7V rails
- Check 5V and noise when front-end card is added and pulser/HV connected
- Check between two FEE64 grounds
- Check direct out of PSU vs ground to see if 1.4 MHz appears on PSU side or FEE64 side
-
11.10.22 Updates
Attachement 11 - 5V PSU on upper PSU with no FEEs attached whatsoever. No 1.4 MHz (on FFT) but clear low frequency beats from switching - presumably low/no load behaviour
Attachement 12 - 5V PSU on aida12 with 8 FEEs on PSU. Longer time base to allow lower frequencies in FFT. 1.4 MHz switching spikes visible but nothing around 100 kHz region
Attachments 13-16: 5V PSU on aida12 at 20 mV/div vertical and 1, 0.5, 2, 5 us/div horizontal respectively
12.10.22 Updates
Attachment 17: -6V PSU on aida12 with 8 FEEs on PSU. 2 us/div timebase. 20 mV/div amplitude
Attachment 18: 10 ms timebase and FFT
Average voltage: -6.21 V
Attachment 19: 7V PSU on aida12 with 8 FEEs on PSU. 2 us/div timebase. 20 mV/div amplitude
Attachment 18: 10 ms timebase and FFT
Average voltage: 7.46V
Measurement between AIDA12 ground and Reference ground/copper bar
+ve (red probe) attached to copper bar at ground point (not strong connection at present)
-ve (black probe) attached to ground crimp on aida12 (connected to cooling plate)
aida12 no adapter board connected: connections are PSU, Ethernet, HDMI and TTY only
Attachment 21: 5 us/div 100 mv/div waveform, big oscillations present. Not seen before FEEs turned on (8 FEES, 1-7+12)
Attachment 22: 10 ms/div for FFT, sharp peak at exactly 100 kHz observed...
Attachment 23: Between 5V PSU (+ve) and 19" rack (-ve) with no FEEs connected to PSU
See strong 100 kHz oscillations too, note that voltage isn't 5V as PSU is floating w.r.t. ground
Looks to be common mode noise (on both 5V and Return of PSU)
Attachment 24: Same as 21 but using thick crocodile clips on probe to ground and aida12. Noise is attenuated but still present |
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Mon Jan 13 17:38:18 2025, TD, Offline analysis of S505 data files 10x
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First timestamp of R2_105 0x16FAEC5E54AABF6C
GMT: Wednesday, June 22, 2022 11:01:42.903 AM
Your time zone: Wednesday, June 22, 2022 12:01:42.903 PM GMT+01:00 DST
First timestamp of R3_150 0x16FB3CE72ED53CB6
GMT: Thursday, June 23, 2022 11:37:31.609 AM
Your time zone: Thursday, June 23, 2022 12:37:31.609 PM GMT+01:00 DST
First timestamp of R5_35 0x16FB89F33F9B44E2
GMT: Friday, June 24, 2022 11:09:25.825 AM
Your time zone: Friday, June 24, 2022 12:09:25.825 PM GMT+01:00 DST
First timestamp of R5_299 0x16FBD8CC5DCBE912
GMT: Saturday, June 25, 2022 11:14:20.247 AM
Your time zone: Saturday, June 25, 2022 12:14:20.247 PM GMT+01:00 DST
First timestamp of R5_546 0x16FC220EA8ADB132
GMT: Sunday, June 26, 2022 9:36:49.320 AM
Your time zone: Sunday, June 26, 2022 10:36:49.320 AM GMT+01:00 DST
Attachments 1-5 - analysis of data files R2_105, R3_150, R5_35, R5_299, and R5_536 (c. one data file per day of S505)
FEE64 #1 (aida02) *time averaged* deadtime c. 12-18%, deadtime of all other FEE64s much lower
Attachments 6-10 - per DSSSD LEC p+n junction versus n+n Ohmic energy - X & y-axes 20keV/channel
No evidence of off-axis energy correlation observed in the postrun background/calibration runs - see https://elog.ph.ed.ac.uk/DESPEC/670 |
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Mon Feb 26 13:17:51 2024, TD, Offline analysis of DEC23/R9_6 9x
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First pass analysis of data file /TapeData/DEC23/R9_6
*** TDR format 3.3.0 analyser - TD - May 2021
*** ERROR: READ I/O error: 5002
blocks: 32000
ADC data format: 234532726 ( 99567.1 Hz)
Other data format: 27387282 ( 11626.8 Hz)
Sample trace data format: 0 ( 0.0 Hz)
Undefined format: 0 ( 0.0 Hz)
Other data format type: PAUSE: 53 ( 0.0 Hz)
RESUME: 53 ( 0.0 Hz)
SYNC100: 40775 ( 17.3 Hz)
WR48-63: 40775 ( 17.3 Hz)
FEE64 disc: 2928025 ( 1243.0 Hz)
MBS info: 24377601 ( 10349.1 Hz)
Other info: 0 ( 0.0 Hz)
ADC data range bit set: 287073 ( 121.9 Hz)
Timewarps: ADC: 0 ( 0.0 Hz)
PAUSE: 0 ( 0.0 Hz)
RESUME: 0 ( 0.0 Hz)
SYNC100: 0 ( 0.0 Hz)
WR48-63: 0 ( 0.0 Hz)
FEE64 disc: 0 ( 0.0 Hz)
MBS info: 0 ( 0.0 Hz)
Undefined: 0 ( 0.0 Hz)
Sample trace: 0 ( 0.0 Hz)
*** Timestamp elapsed time: 2355.524 s
*** Statistics
FEE ADC Data Other Data Sample Undefined Pause Resume SYNC100 WR48-63 Disc MBS Other HEC Data
0 59013868 372005 0 0 20 20 9888 9888 281563 70626 0 55467
1 31445079 1098714 0 0 2 2 5017 5017 243009 845667 0 38876
2 22895499 11841669 0 0 1 1 5294 5294 482655 11348424 0 42748
3 18228498 11705354 0 0 0 0 3913 3913 416619 11280909 0 78526
4 25500772 1237178 0 0 3 3 4320 4320 396557 831975 0 28918
5 4 0 0 0 0 0 0 0 0 0 0 0
6 15933921 394210 0 0 0 0 2560 2560 389090 0 0 11489
7 61515085 738152 0 0 27 27 9783 9783 718532 0 0 31049
FEE64 configuration https://elog.ph.ed.ac.uk/AIDA/935
Note
- aida06 not connected to DSSSD ( cabling broken - will be replaced later this week )
- LEC ( 20MeV FSR ) data ADC offset corrected
ADC offsets available for 489 of 512 channels and are included in the analysis - 23 strips for which no ADC offsets could be calculated ( usually because there was
no
pulser data ) are not included in analysis
- LEC ( 20MeV FSR ) front-back strip energy difference cut +/- 50 channels ( c. +/- 280keV )
- HEC ( 2GeV FSR ) front-back strip energy difference cut +/-200 channels ( c. +/- 1120MeV )
- LEC ADC data: 13 < channel < 188 ( c. 73-1053keV )
- HEC ADC data: > 13 channels ( c. 73MeV )
- FEE64 hardware thresholds: LEC c. 100keV, HEC c. 200MeV
Attachments 1 & 2 - per pixel HEC-LEC event time difference spectra - 4.096us/channel
Attachments 3 & 4 - per pixel HEC-LEC event time difference spectra - 65.536us/channel
Attachment 5 - DSSSD x-y hit pattern: HEC-LEC event time difference < 4.3s
Majority of events associated with 'hot' p+n junction strips - few plausible decay candidate events - as expected.
z-scale - semi-logarithmic - scattered events are single counts ( blue )
1 count => rate ~ 1/2355s ~ 0.0004Hz, the great majority of pixels have zero counts
Attachment 6 - LEC ( decay ) and HEC ( implant ) events - 262.144us/channel ( 65536 channels = 17.2s )
HEC implants channels 12000-25000 = 216 counts => HEC rate ( in spill ) 63.4Hz
LEC decays channels 12000-25000 = 3865 counts => LEC rate ( in spill ) 1134.1Hz
LEC decays channels 25000-38000 = 2790 counts => LEC rate ( inter spill ) 818.7Hz
Attachment 7 - per pixel HEC-HEC event time difference spectra - 4.096us/channel
Attachment 8 - per pixel LEC-LEC event time difference spectra - 4.096us/channel
Attachment 9 - variables.dat
This is a ( Fortran ) Namelist I/O data file containing of the ADC offsets, FEE64 configuration, LEC and HEC energy difference windows
The ADC offset channel number is calculated as
channel = channel_ident + ( module * 64 ) where module = 0-7 corresponding to AIDA FEE64s aida01-aida08
and is used as follows
ADC data = INT ( RSHIFT( ABS( 32768 - data( i ) ), 3 ) - offset( i ) + 0.5 )
where data(i) is the ADC data item for channel i, offset(i) is the ADC offset for channel i
An ADC offset of -9999 means there was no pulser data for this channel in data files R5 and R11.
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Thu Apr 11 15:28:10 2019, CA, OH, CB, TD, Offline analysis of 290319 files R13 and R16 6x
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X projection of high energy channel ADC hits from R13 (attachment 1)
XY hit pattern from R13 (attachment 2)
-discontinuity observed
-possible timing issues or issues with Event Clustering
X projection of high energy channel ADC hits from R16 (attachment 3)
XY hit pattern from R16 (attachment 4)
-Beam was being diffused at this point, and tpcs were being calibrated.
-Gap between Y strips ~ 23 -> 30
High Energy Ey vs Ex plots from R13 and R16 (attachments 5 and 6 respectively) |
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Wed Jan 15 11:58:08 2025, TD, Offline analysis data files S505 R3_9 - R3_128 (207Hg setting) 27x
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Aanlysis data files R3_9 - R3_128 (207Hg setting)
Data file R3_9 first WR ts 0x16FB110A37376D88
GMT: Wednesday, June 22, 2022 10:13:43.562 PM
Your time zone: Wednesday, June 22, 2022 11:13:43.562 PM GMT+01:00 DST
Data file R3_69 first WR ts 0x16FB2286FAD71896
GMT: Thursday, June 23, 2022 3:34:11.118 AM
Your time zone: Thursday, June 23, 2022 4:34:11.118 AM GMT+01:00 DST
Data file R3_128 first WR ts 0x16FB35DF179BD866
GMT: Thursday, June 23, 2022 9:28:40.278 AM
Your time zone: Thursday, June 23, 2022 10:28:40.278 AM GMT+01:00 DST
Attachments 1-3 - analysis data files R3_9, R_69, and R3_128
max. *time averaged* deadtime FEE64 #1 (aida02) 15.7%, 8.6% and 15.6% respectively
all other FEE64 deadtimes < 2%
*** scaler( 1): 120442206 DSSSD#1 decay events LEC m_p = 1 and LEC m_n = 1, 151.2keV < ADC data < 1008keV *and* HEC m_p = HEC m_n = 0, ADC data > 151.2MeV
*** scaler( 2): 51126024 DSSSD#2 decay events LEC m_p = 1 and LEC m_n = 1, 151.2keV < ADC data < 1008keV *and* HEC m_p = HEC m_n = 0, ADC data > 151.2MeV
*** scaler( 3): 5630250 DSSSD#1 implant events HEC m_p > 0 and HEC m_n > 0, ADC data > 151.2MeV
*** scaler( 4): 4983984 DSSSD#2 implant events HEC m_p > 0 and HEC m_n > 0, ADC data > 151.2MeV
*** scaler( 5): 42439339 DSSSD#1 other events HEC m_p > 0 or HEC m_n > 0 *and* LEC m_p > 8 or LEC m_n > 8
*** scaler( 6): 22316289 DSSSD#2 other events HEC m_p > 0 or HEC m_n > 0 *and* LEC m_p > 8 or LEC m_n > 8
*** scaler( 7): 0
*** scaler( 8): 0
*** scaler( 9): 0
*** scaler(10): 2464294601 FEE64 #1 LEC data items
*** scaler(11): 7641292106
*** scaler(12): 3547670559
*** scaler(13): 6144404472
*** scaler(14): 637262222
*** scaler(15): 2302716728
*** scaler(16): 4511293677
*** scaler(17): 3857002960 FEE64 #8 LEC data items
*** scaler(18): 0
*** scaler(19): 0
*** scaler(20): 7697923 FEE64 #1 HEC data items
*** scaler(21): 7169894
*** scaler(22): 10028407
*** scaler(23): 3045622
*** scaler(24): 4246633
*** scaler(25): 5564911
*** scaler(26): 7196158
*** scaler(27): 1960591 FEE64 #8 HEC data items
*** scaler(28): 0
*** scaler(29): 0
*** scaler(30): 0
*** scaler(31): 0
*** scaler(32): 0
DSSSD#1 implant events
x=m_p=0 1334587
y=m_n=0 4860983
DSSSD#2 implant events
x=m_p=0 1159736
y=m_n=0 2757735
Attachment 4 - per DSSSD LEC E_p versus E_n - x and y-axes 20keV/channel
- LEC energy difference +/- 2000 channels (+/- 11200keV)
- Do not observe the off-axis energy correlations observed in the postrun background/calibration runs
- Do observe expected inter strip charge sharing and charge sharing at DSSSD active area boundary
All subsequent spectra LEC energy difference +/-20 channels (+/- 112keV)
Attachments 5-7 - per FEE64 LEC data item rates (Hz) 268ms/channel - common x and y scales
- no conditions
- 150keV < energy < 1500keV
- energy > 1500keV
Note structure in > 1500keV data not restricted to on spill
Attachments 8-10 - per FEE64 HEC data item rates (Hz) 268ms/channel - common x and y scales
- no conditions
- 100MeV < energy < 1000MeV
- energy > 1000MeV
Attachment 11 per DSSSD decay and implant rates (Hz) 268ms/channel =- common x and y scales
- significant on spill deadtime for DSSSD#1
Attachment 12 - per DSSSD LEC m_p versus m_n
- no conditions
- z_hec=1 (DSSSD#1) and z_hec=3 (DSSSD#2)
Attachment 13 - per DSSSD LEC p strip versus n strip
Attachment 14 - per DSSSD LEC E_p versus E_n - x and y axes 20keV/channel
Attachment 15 - per DSSSD per pixel time difference between successive LEC events (4.096us/channel)
- minimum time difference c. 4us
Attachment 16 - per DSSSD HEC m_p versus m_n
- many more m=0 observed cf. RIKEN data e.g. https://elog.ph.ed.ac.uk/AIDA/583
- more low energy HEC events?
Attachment 17 - per DSSSD HEC p strip versus n strip
- no conditions
- z_hec=1 (DSSSD#1) and z_hec=3 (DSSSD#2)
- z_hec=1 => implant stops in DSSSD#1
- z_hec=3 => implant hits DSSSD#1 and DSSSD#2 but does not necessarily stop in DSSSD#2
Attachment 18 - per DSSSD HEC E_p versus E_n - x and y axes 20MeV/channel
Attachment 19 - DSSSD#1 HEC E_p versus DSSSD#2 E_p - x and y axes 20MeV/channel
Attachment 20 - DSSSD#1 LEC E_p versus DSSSD#2 E_p - x and y axes 20keV/channel
- y=0 12816818
- x=0 7374435
- x>0 and y>0 2295693
Attachment 21 - per DSSSD per pixel time difference between successive HEC events (4.096us/channel)
- minimum time difference c. 36us which make sense - c. readout time of ASIC with all 16 channels active
- origin of 9 channel period spectrum structure?
Attachments 22-23 - per DSSSD per pixel time difference between HEC and LEC events (4.096us/channel)
Attachments 24 - per DSSSD per pixel time difference between HEC and LEC events (1s/channel)
- for ions stopped in DSSSD#1 or DSSSD'2 - no PID selection
- minimum time difference c. 88us
- effect of high on spill deadtime apparent per S100 analysis
Attachment 25 - per DSSSD per pixel time difference between HEC and LEC events (1s/channel) versus
- HEC energy
- LEC energy
- p and n strip
Attachment 26 - per DSSSD implant and decay event p strip - n strip time difference (2us/channel)
- wider distribution for implant events expected due to number of ASIC active channels in implant events
- most decay events +/-2us - lower ASIC occupancy for decay events so most events will be from same (or adjacent) clock cycle
Attachment 27 - per DSSSD decay event p strip - n strip time difference (2us/channel) versus decay (E_p - E_n) (20keV channel) |
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Wed Feb 12 10:46:01 2025, TD, Offline analysis data files S181 R4_351-396 25x
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Analysis data files R4_351-396
Data file R4_351 first WR ts 0x17D7B4C72B0BA9C8
Converting hexadecimal timestamp to decimal: 1718040550378809900
Assuming that this timestamp is in nanoseconds (1 billionth of a second):
GMT: Monday, June 10, 2024 5:29:10.378 PM
Your time zone: Monday, June 10, 2024 6:29:10.378 PM GMT+01:00 DST
Relative: 8 months ago
Data file R4_396 first WR ts 0x17D7BE86408888E8
Converting hexadecimal timestamp to decimal: 1718051266682718500
Assuming that this timestamp is in nanoseconds (1 billionth of a second):
GMT: Monday, June 10, 2024 8:27:46.682 PM
Your time zone: Monday, June 10, 2024 9:27:46.682 PM GMT+01:00 DST
Relative: 8 months ago
Attachments 1-2 - analysis data files R4_351 and R4_396
max. *time averaged* deadtime FEE64 #7 (aida08) 1.7% and 1.7% respectively
all other FEE64 deadtimes < 1%
FEE64 configuration
FEE64 a b c
g h
d e f
a b c d e f g h
DSSSD#1 15 3 12 9 1 5 2 4
DSSSD#2 11 7 16 10 14 13 6 8
n+n Ohmic FEE64s 2, 4, 6, 8
Data analysis assumes
- all LEC ADC data channels with valid ADC offset included (1012 of 1024 channels)
LEC calibration ADC offset only
- no clustering
- no multiplex timestamp correction
- no p+n junction side - n+n Ohmic side correlation time gates
- FEE64 *not* DSSSD strip ordering
- hardware - slow comparator setting p+n junction FEE64s 100keV, n+n Ohmic FEE64s 150keV
- LEC energy difference +/- 11200keV (wide open for first pass analysis)
- HEC energy difference +/- 1.68GeV
- valid LEC events
p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1
LEC energy > 151keV
to select candidate beta and alpha events - will include light ions
standalone analysis of AIDA data, no downstream veto detector
- valid HEC events
p+n junction side multiplicity > 0 and n+n Ohmic side multiplicity > 0
(x,y) strips corresponding to maximum energy
p+n junction and n+n Ohmic side HEC
- HEC veto
p+n junction side multiplicity > 0 or n+n Ohmic side multiplicity > 0
- per pixel implant-decay correlations
- end of event
difference in WR timestamp between successive ADC data items > 2500 and overall event length < 33us
Number of events observed
*** scaler # 1 count: 35941696 DSSSD#1 decay events LEC m_p = 1 and LEC m_n = 1, ADC data > 151.2keV *and* HEC m_p = HEC m_n = 0, ADC data > 151.2MeV
*** scaler # 2 count: 31960753 DSSSD#2 decay events LEC m_p = 1 and LEC m_n = 1, ADC data > 151.2keV *and* HEC m_p = HEC m_n = 0, ADC data > 151.2MeV
*** scaler # 3 count: 1499844 DSSSD#1 implant events HEC m_p > 0 and HEC m_n > 0, ADC data > 151.2MeV
*** scaler # 4 count: 1297356 DSSSD#2 implant events HEC m_p > 0 and HEC m_n > 0, ADC data > 151.2MeV
*** scaler # 5 count: 5446969 DSSSD#1 other events HEC m_p > 0 or HEC m_n > 0 *and* LEC m_p > 8 or LEC m_n > 8
*** scaler # 6 count: 75030747 DSSSD#2 other events HEC m_p > 0 or HEC m_n > 0 *and* LEC m_p > 8 or LEC m_n > 8
DSSSD#1 implant events
x=m_p=0 ?
y=m_n=0 ?
DSSSD#2 implant events
x=m_p=0 ?
y=m_n=0 ?
Attachments 3-6 - per FEE64 LEC data item rates 268ms/channel - common x and y scales
- no conditions
- 150keV < energy < 1500keV
- energy > 1500keV
Some deadtime observed on spill, none observed off spill. No significant variation in per FEE64 LEC data rates.
Attachments 7-8 - per FEE64 LEC hit patterns
- 150keV < energy < 1500keV
- energy > 1500keV
Aside from usual hot channels at cable/DSSSD boundaries good hit pattern observed. For > 1500keV events observe flat field in x-plane, focussed in y-plane.
Attachments 9-11 - per FEE64 HEC data item rates 268ms/channel - common x and y scales
- no conditions
- 100MeV < energy < 1000MeV
- energy > 1000MeV
Note hot HEC channel in aida08 - should be disabled.
Attachment 12 - per DSSSD decay and implant rates 262us/channel - common x and y scales
Attachment 13 - per DSSSD LEC m_p versus m_n
- no conditions
Attachment 14 - per DSSSD LEC p strip versus n strip
- no conditions
Attachments 15-16 - per DSSSD LEC E_p versus E_n - x and y-axes 20keV/channel
- LEC energy difference +/- 2000 channels (+/- 11200keV)
Attachments 17-18 - per DSSSD p strip versus n strip
- HEC-LEC time difference <1s
- HEC-LEC time difference <100s
Attachment 19 - per DSSSD HEC m_p versus m_n
Attachment 20 - per DSSSD HEC p strip versus n strip
- no conditions
- z_hec=1 => implant stops in DSSSD#1
- z_hec=3 => implant hits DSSSD#1 and DSSSD#2 but does not necessarily stop in DSSSD#2
Attachment 21 - per DSSSD HEC E_p versus E_n - x and y axes 20MeV/channel
Attachment 22 - DSSSD#1 HEC E_p versus DSSSD#2 HEC E_p - x and y axes 20MeV/channel
- few events stop in DSSSD#2
- most events lower Z and A - fission fragments?
Attachment 23 - per DSSSD per pixel HEC-LEC time difference 4.096us/channel
- events observed to <<100us
Attachment 24 - per DSSSD per pixel HEC-LEC time difference (1s/channel) versus LEC energy (20keV/channel)
- alpha events long lived
- some evidence of effect of on spill deadtime in implant-decay correlations (cf. S100 and S505)
Attachment 25 - per DSSSD implant and decay event p strip - n strip time difference (2us/channel)
- wider distribution for implant events as expected due to number of ASIC active channels in implant events
- most decay events +/-2us - lower ASIC occupancy for decay events so most events will be from same (or adjacent) clock cycle |
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Sat Feb 22 12:35:38 2025, TD, Offline analysis data files R9_85-R9_199 (84Mo setting) 22x
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Start 00:43 22.2.25 https://elog.gsi.de/despec/G-24-00302/57
AIDA data file R9_85
Converting hexadecimal timestamp to decimal: 1740181266259754800
Assuming that this timestamp is in nanoseconds (1 billionth of a second):
GMT: Friday, February 21, 2025 11:41:06.259 PM
Your time zone: Friday, February 21, 2025 11:41:06.259 PM GMT+00:00
End 12:56 22.2.25 https://elog.gsi.de/despec/G-24-00302/85 (start of next degrader setting)
AIDA data file R9_199
Converting hexadecimal timestamp to decimal: 1740224934731157800
Assuming that this timestamp is in nanoseconds (1 billionth of a second):
GMT: Saturday, February 22, 2025 11:48:54.731 AM
Your time zone: Saturday, February 22, 2025 11:48:54.731 AM GMT+00:00
Analysis data files FEB25/R9_85 and FEB25/R9_199
- no timewarps
- deadtime aida05 c. 37% and 39% due to high SC41 scaler input to MACB - issue subsequently fixed
- deadtime aida04 c. 4%, all other FEE64s <<1%
FEE64 configuration
FEE64 a b c
g h
d e f
a b c d e f g h
DSSSD#1 15 3 12 9 1 5 2 4
n+n Ohmic FEE64s 2, 4
Data analysis assumes
- all LEC ADC data channels with valid ADC offset included (507 of 512 channels)
LEC calibration ADC offset only
- no clustering
- no multiplex timestamp correction
- no p+n junction side - n+n Ohmic side correlation time gates
- FEE64 *not* DSSSD strip ordering
- hardware - slow comparator setting p+n junction FEE64s 100keV, n+n Ohmic FEE64s 150keV
- LEC energy difference +/- 168keV
- HEC energy difference +/- 1.68GeV
- valid LEC events
p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1
151keV < LEC energy < 1000keV
to select candidate beta events
standalone analysis of AIDA data, no downstream veto detector
- valid HEC events
p+n junction side multiplicity > 0 and n+n Ohmic side multiplicity > 0
(x,y) strips corresponding to maximum energy
p+n junction and n+n Ohmic side HEC
- HEC veto
not available - only 1x AIDA DSSSD installed
- per pixel implant-decay correlations
- end of event
difference in WR timestamp between successive ADC data items > 2500 and overall event length < 33us
per FEE64 LEC ADC data items 268ms/channel - attachments 3-5
- all
- 150keV < energy < 1500keV
- energy > 1500keV
absence of high instantaneous rates on spill cf. S181, S100, S505 etc
spill structure visible for energies > 1500keV - probably to be expected as majority of such events should be light ions
per FEE64 HEC ADC data items 268ms/channel - attachments 6-8
- all
- 100MeV < energy < 1000MeV
- energy > 1000MeV
Implant & decay event rates 262us/channel - attachment 9
LEC m_p versus m_n - attachment 10
LEC e_p versus e_n - 20keV/channel - attachment 11
HEC x strip versus y strip - attachment 12
- HEC-LEC implant decay time difference <1s
- HEC-LEC implant decay time difference <100s
shows x-y window used to select 82Nb events
HEC m_p versus m_n - attachment 13
HEC e_p versus e_n - 20MeV/channel - attachment 14
HEC-LEC implant-decay time difference (4ms/channel) versus - attachment 15
- HEC energy
- LEC energy
- x & y strip
x strips 130 & 136 disabled
HEC & LEC p strip - n strip time difference (2us/channel, offset=2000 channels) - attachment 16
HEC E (20MeV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 17
LEC E (20keV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 18
LEC e_p - e_n (5.6keV/channel) versus implant-decay time difference (4.194ms/channel) - attachment 19
HEC x & y strip versus implant-decay time difference (4.194ms/channel) - attachment 20
HEC-LEC implant-decay time difference (8.389ms/channel) for candidate 82Nb events - attachment 21
- blue - forward
- cyan - backward
Note
- no FRS PID
- no HEC dE
- no HEC veto
- no HEC energy gates - assume all events within x-y window *stop* in AIDA DSSSD - 82Nb events known to overlap in x-y with (longer-lived, more numerous) 83Nb events
- no front-back time difference
- no clustering
- *all* LEC channels with valid ADC offsets (507 of 512) included *except* 2x strips 130 & 136
HEC-LEC implant-decay time difference (8.389ms/channel) for candidate 82Nb events - attachment 22
Weighted least squares fit channels 1-12 half life 55(9)ms cf. NNDC 50.0(3)ms. |
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Mon Jan 13 11:32:30 2025, TD, Offline analysis S505 data file R3_150 22x
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Offline analysis of S505 data files R3_150
first WR ts
First timestamp of R3_150 0x16FB3CE72ED53CB6
Epoch converter says ...
GMT: Thursday, June 23, 2022 11:37:31.609 AM
Your time zone: Thursday, June 23, 2022 12:37:31.609 PM GMT+01:00 DST
last WR ts
First timestamp of R3_151 0x16FB3D3042B9E8E6
Epoch converter says ...
GMT: Thursday, June 23, 2022 11:42:45.475 AM
Your time zone: Thursday, June 23, 2022 12:42:45.475 PM GMT+01:00 DST
Analysis of data file R3_150 - attachment 1
max time averaged deadtime FEE64 #1 (aida02) 18.3%
FEE64 configuration
FEE64 a
b d
c
a b c d
DSSSD#1 3 4 1 2
DSSSD#2 7 8 5 6
n+n Ohmic FEE64s 2, 4, 6, 8
Data analysis assumes
- all LEC ADC data channels with valid ADC offset included (474 of 512 channels)
LEC calibration ADC offset only
- no clustering
- no multiplex timestamp correction
- no p+n junction side - n+n Ohmic side correlation time gates
- FEE64 *not* DSSSD strip ordering
- hardware - slow comparator setting p+n junction FEE64s 100keV, n+n Ohmic FEE64s 100keV
- LEC energy difference +/-168keV
- HEC energy difference +/- 1.68GeV
- valid LEC events
DSSSD #1
p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1
DSSSD #2
p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1
151keV < LEC energy < 1008keV
to select candidate beta events and veto higher energy events e.g. light ions
standalone analysis of AIDA data, no downstream veto detector
- valid HEC events
p+n junction side multiplicity > 0 and n+n Ohmic side multiplicity > 0
(x,y) strips corresponding to maximum energy
p+n junction and n+n Ohmic side HEC
- HEC veto
p+n junction side multiplicity > 0 or n+n Ohmic side multiplicity > 0
- per pixel implant-decay correlations
- end of event
difference in WR timestamp between successive ADC data items > 2500 *or* difference in first and last WR timestamp of event < 33us
Attachment 2 per FEE64 LEC data rate (Hz) 268ms/channel
Attachment 3 per FEE64 LEC data rate (Hz) 268ms/channel: 150keV < energy < 1500keV
Attachment 22 per FEE64 LEC data rate (Hz) 268ms/channel: energy > 1500keV
- observe high instantaneous rate on spill
- rate dominated by low energy (<1500keV) events
- rate of higher energy events dominated by on spill events i.e. light ions as expected
- significant deadtime on spill for n+n Omic FEE64 aida02, low deadtime off spill
- deadtime low/zero for all other FEE64s on/off spill
Attachment 4 per FEE64 HEC data rate (Hz) 268ms/channel
Attachment 5 per FEE64 HEC data rate (Hz) 268ms/channel: 100MeV < energy < 1000MeV
Attachment 6 per FEE64 HEC data rate (Hz) 268ms/channel: energy > 1000MeV
- all HEC events on spill as expected
- significant deadtime on spill for n+n Ohmic FEE64 aida02, low deadtime off spill
- deadtime low/zero for all other FEE64s on/off spill
Attachment 7 per DSSSD decay and implant rate (Hz) 268ms/channel
Attachment 8 log scale
yellow - FEE64 aida01 LEC data rate (Hz) 268ms/channel
red - FEE64 aida01 HEC data rate (Hz) 268ms/channel
blue - DSSSD #1 decay rate (Hz) 268ms/channel
green - DSSSD #1 implant rate (Hz) 268ms/channel
Attachment 9 log scale
yellow - FEE64 aida02 LEC data rate (Hz) 268ms/channel
red - FEE64 aida02 HEC data rate (Hz) 268ms/channel
blue - DSSSD #1 decay rate (Hz) 268ms/channel
green - DSSSD #1 implant rate (Hz) 268ms/channel
Attachment 10 log scale
yellow - FEE64 aida05 LEC data rate (Hz) 268ms/channel
red - FEE64 aida05 HEC data rate (Hz) 268ms/channel
blue - DSSSD #2 decay rate (Hz) 268ms/channel
green - DSSSD #2 implant rate (Hz) 268ms/channel
Attachment 11 per DSSSD LEC m_p versus m_n
Attachment 12 per DSSSD LEC x versus y
Attachment 13 per DSSSD LEC p+n junction versus n+n Ohmic energy - x-axis & y-axis 20keV/channel
Attachment 14 per DSSSD HEC m_p versus m_n
Attachment 15 per DSSSD HEC x versus y
Attachment 16 per DSSSD HEC p+n junction versus n+n Ohmic energy - x-axis & y-axis 20MeV/channel
Attachment 17 HEC DSSSD#2 p+n junction versus DSSSD#1 p+n junction energy - x-axis & y-axis 20MeV/channel
to identify which ions stop in DSSSD#2 (z_loc=2)
Attachment 18 decay & implant dx versus dy
Attachment 19 LEC DSSSD#2 p+n junction versus DSSSD#1 p+n junction energy - x-axis & y-axis 20keV/channel
Attachment 20 per DSSSD decay & implant dt (2us/channel)
Attachment 21 per DSSSD decay dt (2us/channel) versus p+n junctionj - n+n Ohmic energy difference (20keV/channel)
Summary
- high instantaneous data rates on spill
- significant deadtime FEE64 #2 on spill
magnitude, structure, position of DSSSD#1 decay rate variations differs from FEE64 #2 deadtime - events merging?
- all other FEE64s OK on/off spill |
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Thu Dec 5 11:18:46 2024, TD, Offline analysis S100 data files R21_0-R21_99 23x
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Offline analysis of S100 data files R21_0 - R21_99 (162Eu setting)
first WR ts
First timestamp of R21_0 0x17CA09154AE3E636
Epoch converter says ...
GMT: Saturday, April 27, 2024 4:36:35.223 AM
Your time zone: Saturday, April 27, 2024 5:36:35.223 AM GMT+01:00 DST
last WR ts
First timestamp of R21_100 0x17CA16C1904150CE
GMT: Saturday, April 27, 2024 8:47:08.772 AM
Your time zone: Saturday, April 27, 2024 9:47:08.772 AM GMT+01:00 DST
FEE64 configuration
FEE64 a b c
g h
d e f
a b c d e f g h
DSSSD#1 15 3 12 9 1 5 2 4
DSSSD#2 11 7 16 10 14 13 6 8
n+n Ohmic FEE64s 2, 4, 6, 8
Data analysis assumes
- all LEC ADC data channels with valid ADC offset included (1012 of 1024 channels)
LEC calibration ADC offset only
- no clustering
- no multiplex timestamp correction
- no p+n junction side - n+n Ohmic side correlation time gates
- FEE64 *not* DSSSD strip ordering
- hardware - slow comparator setting p+n junction FEE64s 100keV, n+n Ohmic FEE64s 150keV
- LEC energy difference +/-168keV
- HEC energy difference +/- 1.68GeV
- valid LEC events
DSSSD #1
p+n junction side multiplicity = 1 and n+n Ohmic side multiplicity = 1
DSSSD #2
0 < p+n junction side multiplicity < 8
and
0 < n+n Ohmic side multiplicity < 8
151keV < LEC energy < 1008keV
to select candidate beta events and veto higher energy events e.g. light ions
standalone analysis of AIDA data, no downstream veto detector
- valid HEC events
p+n junction side multiplicity > 0 and n+n Ohmic side multiplicity > 0
(x,y) strips corresponding to maximum energy
p+n junction and n+n Ohmic side HEC
- HEC veto
p+n junction side multiplicity > 0 or n+n Ohmic side multiplicity > 0
- per pixel implant-decay correlations
- end of event
difference in WR timestamp between successive ADC data items > 2500
Attachments 1-4
per DSSSD p+n junction - n+n Ohmic strip time difference for HEC and LEC events (2us/channel) linear and log scale
- observe large (> 32us) time differences (on log scale)
- range of time differences increases with multiplicity ( DSSSD#1 cf. DSSSD#2 LEC events)
- distribution of HEC time differences can probably be understood in terms of most/all channels of ASIC being active during HEC event with low LEC thresholds
- AIDA is a triggerless DAQ producing streams of ADC data items *not* events
at high instantaneous rates when events are constructed they may become aggregated in time i.e. > 32us readout time of all channels of one ASIC
- To investigate impose additional end of event criterion
difference in first and last WR timestamp of event < 33us
Attachments 5-6
per DSSSD p+n junction - n+n Ohmic strip time difference for HEC and LEC events (2us/channel) linear and log scale
- blue original end of event criteria, cyan new end of event criteria
- as expected range of time differences is restricted to +/- 32us
- observe somewhat higher fraction of events with low time differences
DSSSD #1 10363098 of 16104322 (64%) events +/-2us
DSSSD #2 860454912 of 1766618199 (49%) events +/-2us
Attachment 7
per DSSSD p+n junction - n+n Ohmic strip time difference for LEC events - x-axis 2us/channel, y-axis 20keV /channel
Attachment 8 per FEE64 LEC data rate (Hz) 268ms/channel
Attachment 9 per FEE64 LEC data rate (Hz) 268ms/channel: 150keV < energy < 1500keV
Attachment 10 per FEE64 LEC data rate (Hz) 268ms/channel: energy > 1500keV
- observe high instantaneous rate on spill
- rate dominated by low energy (<1500keV) events
- rate of higher energy events dominated by on spill events i.e. light ions as expected
- significant deadtime on spill for n+n Ohmic FEE64s, low deadtime off spill
- deadtime low/zero for p+n junction FEE64s on/off spill
Attachment 11 per FEE64 LEC hit pattern: 150keV < energy < 1500keV
Attachment 12 per FEE64 LEC hit pattern: energy > 1500keV
Attachment 13 per FEE64 HEC data rate (Hz) 268ms/channel
Attachment 14 per FEE64 HEC data rate (Hz) 268ms/channel: 100MeV < energy < 1000MeV
Attachment 15 per FEE64 HEC data rate (Hz) 268ms/channel: energy > 1000MeV
- rate dominated by low energy (>1GeV) events
- all HEC events on spill as expected (note FEE64 #7 has a single hot channel which can be disabled in software)
- significant deadtime on spill for n+n Ohmic FEE64s, low deadtime off spill
- deadtime low/zero for p+n junction FEE64s on/off spill
Attachment 16 per DSSSD p+n junction versus n+n Ohmic LEC energy - x-axis & y-axis 20keV/channel
Attachment 17 per DSSSD p+n junction versus n+n Ohmic HEC energy - x-axis & y-axis 20MeV/channel
Attachment 18 per DSSSD p+n junction versus n+n Ohmic HEC strip hit pattern: all HEC events
Attachment 19 per DSSSD p+n junction versus n+n Ohmic HEC strip hit pattern
DSSSD #1 ions stopped in DSSSD #1 i.e. DSSSD #2 HEC multiplicity = 0
DSSSD #1 shows x-y gate used ( 270 < x < 370, 20 < y < 90 ) to identify 166Tb implants
DSSSD #2 ions stopped in DSSSD #2 *and* in transmission (can establish which ions stop in DSSSD#2 from DSSSD#2 HEC energy versus DSSSD#1 HEC energy - see https://elog.ph.ed.ac.uk/DESPEC/672
Attachment 20
DSSSD#1 HEC energy (20MeV/channel) versus HEC-LEC dt (1s/channel)
DSSSD#1 LEC energy (20keV/channel) versus HEC-LEC dt (1s/channel)
DSSSD#1 HEC strip # versus HEC-LEC dt (1s/channel)
- Observe # events in every third channel is lower
- Probably reflects implant-decay correlation livetime
For example (choosing some numbers for illustrative purposes)
on spill: HEC livetime 75%, LEC livetime 75% (FEE64 deadtime common for HEC and LEC data) => implant decay correlation livetime 56%
off spill: HEC live time 75%, LEC livetime 100% => implant decay correlation livetime 75%
- Observe 'hot' x channels 315, 318, 321, 324 - disabled for further analysis
- Do not observe any 'hot' y channels
Attachments 21 & 22
DSSSD#1 per pixel HEC-LEC time (1s/channel): x,y,z gated to select 166Tb events
Naive (parent-daughter decay only, flat background) fit for data t=0-26s ( t1/2 = 27.1(3)s )
Fit ignores data for t=0, 3, 6, 10, 13, 16, 19, 22s to avoid bias of differences in implant-decay correlation deadtime
Suggestion of structure at c. 30s period? Does this reflect spill stucture? 10x spill cycles (30s), 9s spill off, ... etc
Sum of x,y,z gated HEC events (s2112 - see attachment 19) = 670441
Elapsed time of dataset 4h11m = 15060s
# pixels = 100 x 70 = 7000
=> # x,y,z gated HEC events per pixel = 670441/7000/15060 = 0.0064/s or mean time between x,y,z gated HEC event = 157s (estimate needs to be corrected for HEC deadtime)
Sum of implant decay correlations (s2220 - see attachment 21) t=0-150s = 273508 - flat background estimated as 150 x 500 = 75000 = 198508
=> efficiency c. 30% (presumably low due to implant-decay deadtime, LEC multiplicity, per pixel correlations and no clustering)
Summary
$64,000 question - what is the origin of the high instantaneous rate on spill for DSSSD#1 ? On my to do list.
Attachment 23
LEC multiplicity with/without HEC data in event
per DSSSD LEC p+n junction multiplicity versus n+n Ohmic multiplicity
per DSSSD LEC p+n junction multiplicity versus n+n Ohmic multiplicity z_hec=1 and z_hec=2
With HEC data
DSSSD#1 p+n junction multiplicity ~ 17, n+n Ohmic multiplicity ~28
DSSSD#2 p+n junction multiplicity ~ 40, n+n Ohmic multiplicity ~23
Assume 200Hz HEC events => DSSSD#1 LEC rate = 200 x ( 17 + 28 ) => 9k LEC data items cf. >100k LEC data items (attachments 8 & 13)
i.e. not due to HEC events
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Sat Apr 20 11:40:38 2024, TD, Offline analysis R12 & R13 ( pulser walkthrough ) 17x
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S100 ADC offsets using pulser walkthrough data from data files R12 & R13
ch = channel + ( module * 64 ) + ( range * 2048 )
adc_data( ch ) = INT( RSHIFT( ABS( adc_data( ch ) - 32768 ), 3 ) - offset( ch ) + 0.5 )
per p+n FEE64 ADC spectra (aida01-aida16 *not* aida02, aida04, aida06 & aida08) - attachments 1-12
Note common x & y-scales - peak height proxy for peak width
aida09 1.8.L (s520) pulser peak width 7 ch FWHM (~40keV FWHM)
per n+n FEE64 ADC spectra (aida02, aida04, aida06 & aida08) - attachments 13-16
Note common x & y-scales - peak height proxy for peak width
aida02 1.8.L (s72) pulser peak width 16 ch FWHM (~88keV FWHM)
ADC offset analysis
/home/npg/td/Calibration/offsets /home/npg/td/S100/R12-R13 50 1024 20 5
First pass sort variables ( ADC offsets, FEE64 configuration, LEC & HEC equal energy cuts ) - attachment 17 |
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Fri Mar 13 15:48:11 2020, Friday 13th 16:00 - 24:00, OH, TD 11x
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ASIC settings 2019Oct31-13.24.23
slow comparator 0xa
BNC PB-5 pulser
amplitude 1.0V , attenuator x1
frequency 2Hz
decay time 1ms
16:51 Bias and leakage currents ok but starting to increase in DSSD 1 predominantly - attachment 1
Statistics ok - attachment 2
FEE temp ok - attachment 3
System wide checks all ok
16:57 Histograms zeroed
17:17 ASIC control check done
17:40 Layout 1 - attachment 4
Layouts 3 and 4 - attachments 4 and 5
Layouts 5 and 6 - attachments 6 and 7
19:06 Earlier in the shift two extra 8TB drives were formatted and mounted
Named SecondDrive and ThirdDrive
TapeData folder created on SecondDrive
Plan is before the end of this shift to move the symbolic link from the filling up drive to the new drive
Current prediction is drive would otherwise be full by 12:20 tomorrow.
Playing it safe and switching early
21:57 Bias and leakage ok - attachment 8
Statistics ok - attachment 9
FEE Temps ok - attachment 10 |
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Thu May 12 16:30:47 2022, NH, OH, TD, Notes for mounting a second switch
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Update DHCPD as expected
Make sure new ethernet device is trusted in firewall
Make sure hosts is updated
make sure /home/Embedded/XilinxLinux/ppc_4xx/rfs/aida08/etc/hosts "myserver" points to correct ip address
make sure /MIDAS/linux-ppc_4xx/startup/aidaXX has netvar "TS_Server" pointing to correct ip address
Update the IP in /MIDAS/linux-ppc_4xx/startup/aida* |
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Wed Apr 14 15:14:55 2021, PJCS, Note Well
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Please note that for the forseeable future the system function in the menu on the System Wide Checks browser page labelled as
"Collect the Timestamp RAM values" and "Start the Readout Timestamp error tracing"
Are for the use of engineers only unless otherwise instructed.
There is no harm in using them but the results may be confusing and it is not possible, at present, to detail a definitive set of instructions for their use. |
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Wed Mar 2 16:00:01 2022, OH, NH, Noise tests - 2nd March
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An interesting find with the new sum inverter is that with the pulser at default settings the pulser peak on the n+n side is above the range of the ADC.
We have checked signals from the sum inverter and pulser and both are equal in magnitude.
We therefor determine it is over range as the charge is spread over 4 FEEs vs 12 on the p+n side.
This possibly wasn't an issue with the previous inverter if it produced a lower amplitude.
For tests going forward p+n voltage will be 2V. n+n voltage will be 0.5V - Attachment 1
Going to look into a 20dB attenuator
Seems there were issues with the lemo cables in the n+n pulser chain |
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